{"id":11504,"date":"2012-01-22T23:14:58","date_gmt":"2012-01-22T23:14:58","guid":{"rendered":"http:\/\/www.ees.it\/?page_id=11504"},"modified":"2018-05-30T12:18:02","modified_gmt":"2018-05-30T12:18:02","slug":"x-ray-analysis","status":"publish","type":"page","link":"https:\/\/ees.it\/en\/x-ray-analysis\/","title":{"rendered":"X-RAY Analysis"},"content":{"rendered":"<p><div class=\"fusion-fullwidth fullwidth-box fusion-builder-row-1 nonhundred-percent-fullwidth non-hundred-percent-height-scrolling\" style=\"--awb-background-position:left top;--awb-border-radius-top-left:0px;--awb-border-radius-top-right:0px;--awb-border-radius-bottom-right:0px;--awb-border-radius-bottom-left:0px;--awb-padding-top:1%;--awb-padding-bottom:1%;--awb-margin-top:0px;--awb-margin-bottom:0px;--awb-border-sizes-top:0px;--awb-border-sizes-bottom:0px;--awb-flex-wrap:wrap;\" ><div class=\"fusion-builder-row fusion-row\"><div class=\"fusion-layout-column fusion_builder_column fusion-builder-column-0 fusion_builder_column_1_1 1_1 fusion-one-full fusion-column-first fusion-column-last fusion-column-no-min-height\" style=\"--awb-bg-size:cover;--awb-margin-bottom:0px;\"><div class=\"fusion-column-wrapper fusion-flex-column-wrapper-legacy\"><div class=\"fusion-text fusion-text-1\"><h1 style=\"text-align: center;\">X-RAY Analysis<\/h1>\n<\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-separator\" style=\"margin-left: auto;margin-right: auto;margin-top:-15px;margin-bottom:20px;width:100%;max-width:300px;\"><div class=\"fusion-separator-border sep-single sep-solid\" style=\"--awb-height:20px;--awb-amount:20px;--awb-sep-color:#00b8e0;border-color:#00b8e0;border-top-width:1px;\"><\/div><\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-text fusion-text-2\"><h3 style=\"text-align: center;\"><strong>Verification of electronic connections that are invisible from the outside<\/strong><\/h3>\n<\/div><div class=\"fusion-clearfix\"><\/div><\/div><\/div><\/div><\/div><div class=\"fusion-fullwidth fullwidth-box fusion-builder-row-2 nonhundred-percent-fullwidth non-hundred-percent-height-scrolling\" style=\"--awb-background-position:left top;--awb-border-radius-top-left:0px;--awb-border-radius-top-right:0px;--awb-border-radius-bottom-right:0px;--awb-border-radius-bottom-left:0px;--awb-padding-top:0px;--awb-padding-right:0px;--awb-padding-bottom:0px;--awb-padding-left:0px;--awb-border-sizes-top:0px;--awb-border-sizes-bottom:0px;--awb-flex-wrap:wrap;\" ><div class=\"fusion-builder-row fusion-row\"><div class=\"fusion-layout-column fusion_builder_column fusion-builder-column-1 fusion_builder_column_1_1 1_1 fusion-one-full fusion-column-first fusion-column-last fusion-column-no-min-height\" style=\"--awb-bg-size:cover;--awb-margin-bottom:0px;\"><div class=\"fusion-column-wrapper fusion-flex-column-wrapper-legacy\"><div class=\"fusion-text fusion-text-3\"><p>The X-ray inspection is not a luxury, but it is a necessary process step with which to verify those electronic connections that are invisible from the outside (BGA, LGA, QFN, CSP etcc ..).<\/p>\n<p>EES uses a micro-focus X-ray system to verify the quality of the welds, to evaluate the size of any voids, to search for faults and to identify the critical points on which to intervene for the repair of printed circuits, connectors and wiring in general.<\/p>\n<p>With Nikon Metrology XT V 160 we have the ability to quickly track any internal errors that otherwise would remain hidden in the product with a direct effect on its quality; moreover thanks to this analysis we have the possibility to refine the constructive process and to increase the productivity and the speed of response towards the ns. customer.<\/p>\n<p>The Nikon XV 160 system is equipped with a 5-axis system that allows a 360-degree analysis of the object under examination, and thanks to the 160 kV micro focus x-ray tube we are able to analyze high-density materials, such as some houses of complex electronic components.<\/p>\n<\/div><div class=\"fusion-clearfix\"><\/div><\/div><\/div><\/div><\/div><div class=\"fusion-fullwidth fullwidth-box fusion-builder-row-3 nonhundred-percent-fullwidth non-hundred-percent-height-scrolling\" style=\"--awb-border-radius-top-left:0px;--awb-border-radius-top-right:0px;--awb-border-radius-bottom-right:0px;--awb-border-radius-bottom-left:0px;--awb-padding-top:0px;--awb-margin-top:0px;--awb-flex-wrap:wrap;\" ><div class=\"fusion-builder-row fusion-row\"><div class=\"fusion-layout-column fusion_builder_column fusion-builder-column-2 fusion_builder_column_1_1 1_1 fusion-one-full fusion-column-first fusion-column-last\" style=\"--awb-bg-size:cover;\"><div class=\"fusion-column-wrapper fusion-flex-column-wrapper-legacy\"><div class=\"fusion-text fusion-text-4\"><h1 style=\"text-align: center;\">The Machine<\/h1>\n<\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-separator\" style=\"margin-left: auto;margin-right: auto;margin-top:-15px;margin-bottom:20px;width:100%;max-width:300px;\"><div class=\"fusion-separator-border sep-single sep-solid\" style=\"--awb-height:20px;--awb-amount:20px;--awb-sep-color:#00b8e0;border-color:#00b8e0;border-top-width:1px;\"><\/div><\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-clearfix\"><\/div><\/div><\/div><\/div><\/div><div class=\"fusion-fullwidth fullwidth-box fusion-builder-row-4 nonhundred-percent-fullwidth non-hundred-percent-height-scrolling fusion-equal-height-columns\" style=\"--awb-border-radius-top-left:0px;--awb-border-radius-top-right:0px;--awb-border-radius-bottom-right:0px;--awb-border-radius-bottom-left:0px;--awb-flex-wrap:wrap;\" ><div class=\"fusion-builder-row fusion-row\"><div class=\"fusion-layout-column fusion_builder_column fusion-builder-column-3 fusion_builder_column_1_1 1_1 fusion-one-full fusion-column-first fusion-column-last border-rad-5, border-shadow\" style=\"--awb-padding-top:20px;--awb-padding-right:20px;--awb-padding-bottom:15px;--awb-padding-left:7px;--awb-bg-size:cover;--awb-border-color:#eaeaea;--awb-border-top:1px;--awb-border-right:1px;--awb-border-bottom:1px;--awb-border-left:1px;--awb-border-style:solid;\"><div class=\"fusion-column-wrapper fusion-flex-column-wrapper-legacy\"><div class=\"fusion-text fusion-text-5\"><h3 style=\"text-align: center;\"><strong>X-RAY NanoTech 160KV by Nikon Metrology<\/strong><\/h3>\n<\/div><div class=\"fusion-builder-row fusion-builder-row-inner fusion-row\"><div class=\"fusion-layout-column fusion_builder_column_inner fusion-builder-nested-column-0 fusion_builder_column_inner_1_3 1_3 fusion-one-third fusion-column-first\" style=\"--awb-bg-size:cover;width:33.333333333333%;width:calc(33.333333333333% - ( ( 4% ) * 0.33333333333333 ) );margin-right: 4%;\"><div class=\"fusion-column-wrapper fusion-flex-column-wrapper-legacy\"><div class=\"fusion-column-content-centered\"><div class=\"fusion-column-content\"><div class=\"fusion-image-element in-legacy-container\" style=\"--awb-caption-title-font-family:var(--h2_typography-font-family);--awb-caption-title-font-weight:var(--h2_typography-font-weight);--awb-caption-title-font-style:var(--h2_typography-font-style);--awb-caption-title-size:var(--h2_typography-font-size);--awb-caption-title-transform:var(--h2_typography-text-transform);--awb-caption-title-line-height:var(--h2_typography-line-height);--awb-caption-title-letter-spacing:var(--h2_typography-letter-spacing);\"><span class=\" fusion-imageframe imageframe-none imageframe-1 hover-type-none\"><img decoding=\"async\" width=\"300\" height=\"300\" title=\"x-ray-inspection-nanotech-160kv\" src=\"https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/x-ray-inspection-nanotech-160kv-300x300.jpg\" alt class=\"img-responsive wp-image-13786\" srcset=\"https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/x-ray-inspection-nanotech-160kv-200x200.jpg 200w, https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/x-ray-inspection-nanotech-160kv.jpg 400w\" sizes=\"(max-width: 800px) 100vw, 300px\" \/><\/span><\/div><\/div><\/div><div class=\"fusion-clearfix\"><\/div><\/div><\/div><div class=\"fusion-layout-column fusion_builder_column_inner fusion-builder-nested-column-1 fusion_builder_column_inner_2_3 2_3 fusion-two-third fusion-column-last\" style=\"--awb-bg-size:cover;width:66.666666666667%;width:calc(66.666666666667% - ( ( 4% ) * 0.66666666666667 ) );\"><div class=\"fusion-column-wrapper fusion-flex-column-wrapper-legacy\"><div class=\"fusion-column-content-centered\"><div class=\"fusion-column-content\"><div class=\"fusion-text fusion-text-6\"><p>X-RAY NanoTech 160KV by Nikon MetrologCon Nikon Metrology XT V 160 allows you to quickly track any internal errors that would otherwise remain hidden in the product with a direct effect on its quality; moreover thanks to this analysis we have the possibility to refine the constructive process and to increase the productivity and the speed of response towards the ns. customer.<\/p>\n<p>The Nikon XV 160 system is equipped with a 5-axis system that allows a 360-degree analysis of the object under examination, and thanks to the 160 kV micro focus x-ray tube we are able to analyze high-density materials, such as some houses of complex electronic components<\/p>\n<\/div><div class=\"fusion-align-block\"><a class=\"fusion-button button-flat fusion-button-default-size button-default fusion-button-default button-1 fusion-button-span-yes fusion-button-default-type\" target=\"_self\" href=\"#\" data-toggle=\"modal\" data-target=\".fusion-modal.X-RAY\"><span class=\"fusion-button-text awb-button__text awb-button__text--default\">See the details<\/span><\/a><\/div><\/div><\/div><div class=\"fusion-clearfix\"><\/div><\/div><\/div><\/div><div class=\"fusion-modal modal fade modal-1 X-RAY\" tabindex=\"-1\" role=\"dialog\" aria-labelledby=\"modal-heading-1\" aria-hidden=\"true\" style=\"--awb-border-color:#ebebeb;--awb-background:#f6f6f6;\"><div class=\"modal-dialog modal-lg\" role=\"document\"><div class=\"modal-content fusion-modal-content\"><div class=\"modal-header\"><button class=\"close\" type=\"button\" data-dismiss=\"modal\" aria-hidden=\"true\" aria-label=\"Close\">&times;<\/button><h3 class=\"modal-title\" id=\"modal-heading-1\" data-dismiss=\"modal\" aria-hidden=\"true\">X-RAY NanoTech 160KV di Nikon Metrology<\/h3><\/div><div class=\"modal-body fusion-clearfix\"><a href=\"https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/icon-pdf.ico\"><img decoding=\"async\" class=\"alignnone size-medium wp-image-13731\" src=\"https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/icon-pdf.ico\" alt=\"\" width=\"1\" height=\"1\" \/><\/a><a href=\"https:\/\/ees.it\/wp-content\/uploads\/2012\/01\/Nikon_X-RAY-XTV1601.pdf\" target=\"_blank\" rel=\"noopener\"><img decoding=\"async\" class=\"aligncenter wp-image-13734\" src=\"https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/icon-pdf-150x150.png\" alt=\"\" width=\"50\" height=\"50\" srcset=\"https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/icon-pdf-66x66.png 66w, https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/icon-pdf-150x150.png 150w, https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/icon-pdf-200x200.png 200w, https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/icon-pdf.png 256w\" sizes=\"(max-width: 50px) 100vw, 50px\" \/><\/a><\/p>\n<p style=\"text-align: center;\"><a href=\"https:\/\/ees.it\/wp-content\/uploads\/2012\/01\/Nikon_X-RAY-XTV1601.pdf\" target=\"_blank\" rel=\"noopener\">Download the illustrative PDF file of the machine<\/a><\/p>\n<div class=\"fusion-tabs fusion-tabs-1 classic nav-is-justified horizontal-tabs icon-position-left mobile-mode-accordion\" style=\"--awb-title-border-radius-top-left:0px;--awb-title-border-radius-top-right:0px;--awb-title-border-radius-bottom-right:0px;--awb-title-border-radius-bottom-left:0px;--awb-inactive-color:#ebeaea;--awb-background-color:#ffffff;--awb-border-color:#ebeaea;--awb-active-border-color:#1a80b6;\"><div class=\"nav\"><ul class=\"nav-tabs nav-justified\" role=\"tablist\"><li class=\"active\" role=\"presentation\"><a class=\"tab-link\" data-toggle=\"tab\" role=\"tab\" aria-controls=\"tab-59b6d15e5afd1ba50be\" aria-selected=\"true\" id=\"fusion-tab-images\" href=\"#tab-59b6d15e5afd1ba50be\"><h4 class=\"fusion-tab-heading\">Images<\/h4><\/a><\/li><li role=\"presentation\"><a class=\"tab-link\" data-toggle=\"tab\" role=\"tab\" aria-controls=\"tab-cf8830612e6eba1df11\" aria-selected=\"false\" tabindex=\"-1\" id=\"fusion-tab-video\" href=\"#tab-cf8830612e6eba1df11\"><h4 class=\"fusion-tab-heading\">Video<\/h4><\/a><\/li><li role=\"presentation\"><a class=\"tab-link\" data-toggle=\"tab\" role=\"tab\" aria-controls=\"tab-1bb893b30768987bc92\" aria-selected=\"false\" tabindex=\"-1\" id=\"fusion-tab-periodicmaintenance\" href=\"#tab-1bb893b30768987bc92\"><h4 class=\"fusion-tab-heading\">Periodic Maintenance<\/h4><\/a><\/li><\/ul><\/div><div class=\"tab-content\"><div class=\"nav fusion-mobile-tab-nav\"><ul class=\"nav-tabs nav-justified\" role=\"tablist\"><li class=\"active\" role=\"presentation\"><a class=\"tab-link\" data-toggle=\"tab\" role=\"tab\" aria-controls=\"tab-59b6d15e5afd1ba50be\" aria-selected=\"true\" id=\"mobile-fusion-tab-images\" href=\"#tab-59b6d15e5afd1ba50be\"><h4 class=\"fusion-tab-heading\">Images<\/h4><\/a><\/li><\/ul><\/div><div class=\"tab-pane fade fusion-clearfix in active\" role=\"tabpanel\" tabindex=\"0\" aria-labelledby=\"fusion-tab-images\" id=\"tab-59b6d15e5afd1ba50be\">\n<p><img decoding=\"async\" class=\"wp-image-456 size-medium aligncenter\" src=\"https:\/\/ees.it\/wp-content\/uploads\/2012\/01\/x-ray-inspection-machine-for-circuit-boards-447289-258x300.jpg\" alt=\"XT V 160\" width=\"258\" height=\"300\" srcset=\"https:\/\/ees.it\/wp-content\/uploads\/2012\/01\/x-ray-inspection-machine-for-circuit-boards-447289-258x300.jpg 258w, https:\/\/ees.it\/wp-content\/uploads\/2012\/01\/x-ray-inspection-machine-for-circuit-boards-447289.jpg 517w\" sizes=\"(max-width: 258px) 100vw, 258px\" \/><\/p>\n<\/div><div class=\"nav fusion-mobile-tab-nav\"><ul class=\"nav-tabs nav-justified\" role=\"tablist\"><li role=\"presentation\"><a class=\"tab-link\" data-toggle=\"tab\" role=\"tab\" aria-controls=\"tab-cf8830612e6eba1df11\" aria-selected=\"false\" tabindex=\"-1\" id=\"mobile-fusion-tab-video\" href=\"#tab-cf8830612e6eba1df11\"><h4 class=\"fusion-tab-heading\">Video<\/h4><\/a><\/li><\/ul><\/div><div class=\"tab-pane fade fusion-clearfix\" role=\"tabpanel\" tabindex=\"0\" aria-labelledby=\"fusion-tab-video\" id=\"tab-cf8830612e6eba1df11\"><div class=\"fusion-video fusion-youtube fusion-aligncenter\" style=\"--awb-max-width:600px;--awb-max-height:400px;--awb-width:100%;\"><div class=\"video-shortcode\"><div class=\"fluid-width-video-wrapper\" style=\"padding-top:66.67%;\" ><iframe title=\"YouTube video player 1\" src=\"https:\/\/www.youtube.com\/embed\/xOOigsxoZWo?wmode=transparent&autoplay=0\" width=\"600\" height=\"400\" allowfullscreen allow=\"autoplay; clipboard-write; encrypted-media; gyroscope; picture-in-picture;\"><\/iframe><\/div><\/div><\/div><\/div><div class=\"nav fusion-mobile-tab-nav\"><ul class=\"nav-tabs nav-justified\" role=\"tablist\"><li role=\"presentation\"><a class=\"tab-link\" data-toggle=\"tab\" role=\"tab\" aria-controls=\"tab-1bb893b30768987bc92\" aria-selected=\"false\" tabindex=\"-1\" id=\"mobile-fusion-tab-periodicmaintenance\" href=\"#tab-1bb893b30768987bc92\"><h4 class=\"fusion-tab-heading\">Periodic Maintenance<\/h4><\/a><\/li><\/ul><\/div><div class=\"tab-pane fade fusion-clearfix\" role=\"tabpanel\" tabindex=\"0\" aria-labelledby=\"fusion-tab-periodicmaintenance\" id=\"tab-1bb893b30768987bc92\">\n<div class=\"table-1\">\n<table width=\"100%\">\n<tbody>\n<tr>\n<td align=\"left\"><strong>Periodic Maintenance<\/strong><\/td>\n<td align=\"right\">under construction<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div><div class=\"fusion-clearfix\"><\/div><\/div><\/div><\/div><\/div><\/p>\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"100-width.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-11504","page","type-page","status-publish","hentry"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.3 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>X-RAY Analysis - Electronic Engineering Service<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/ees.it\/en\/x-ray-analysis\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"X-RAY Analysis - Electronic Engineering Service\" \/>\n<meta property=\"og:url\" content=\"https:\/\/ees.it\/en\/x-ray-analysis\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Engineering Service\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/ees.spa.it\" \/>\n<meta property=\"article:modified_time\" content=\"2018-05-30T12:18:02+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/icon-pdf.ico\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"8 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/ees.it\\\/en\\\/x-ray-analysis\\\/\",\"url\":\"https:\\\/\\\/ees.it\\\/en\\\/x-ray-analysis\\\/\",\"name\":\"X-RAY Analysis - Electronic Engineering Service\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/ees.it\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/ees.it\\\/en\\\/x-ray-analysis\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/ees.it\\\/en\\\/x-ray-analysis\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/ees.it\\\/wp-content\\\/uploads\\\/2017\\\/12\\\/icon-pdf.ico\",\"datePublished\":\"2012-01-22T23:14:58+00:00\",\"dateModified\":\"2018-05-30T12:18:02+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/ees.it\\\/en\\\/x-ray-analysis\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/ees.it\\\/en\\\/x-ray-analysis\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/ees.it\\\/en\\\/x-ray-analysis\\\/#primaryimage\",\"url\":\"https:\\\/\\\/ees.it\\\/wp-content\\\/uploads\\\/2017\\\/12\\\/icon-pdf.ico\",\"contentUrl\":\"https:\\\/\\\/ees.it\\\/wp-content\\\/uploads\\\/2017\\\/12\\\/icon-pdf.ico\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/ees.it\\\/en\\\/x-ray-analysis\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/ees.it\\\/en\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"X-RAY Analysis\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/ees.it\\\/#website\",\"url\":\"https:\\\/\\\/ees.it\\\/\",\"name\":\"Electronic Engineering Service\",\"description\":\"Apparecchiature e schede elettroniche\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/ees.it\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"X-RAY Analysis - Electronic Engineering Service","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/ees.it\/en\/x-ray-analysis\/","og_locale":"en_US","og_type":"article","og_title":"X-RAY Analysis - Electronic Engineering Service","og_url":"https:\/\/ees.it\/en\/x-ray-analysis\/","og_site_name":"Electronic Engineering Service","article_publisher":"https:\/\/www.facebook.com\/ees.spa.it","article_modified_time":"2018-05-30T12:18:02+00:00","og_image":[{"url":"https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/icon-pdf.ico","type":"","width":"","height":""}],"twitter_misc":{"Est. reading time":"8 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/ees.it\/en\/x-ray-analysis\/","url":"https:\/\/ees.it\/en\/x-ray-analysis\/","name":"X-RAY Analysis - Electronic Engineering Service","isPartOf":{"@id":"https:\/\/ees.it\/#website"},"primaryImageOfPage":{"@id":"https:\/\/ees.it\/en\/x-ray-analysis\/#primaryimage"},"image":{"@id":"https:\/\/ees.it\/en\/x-ray-analysis\/#primaryimage"},"thumbnailUrl":"https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/icon-pdf.ico","datePublished":"2012-01-22T23:14:58+00:00","dateModified":"2018-05-30T12:18:02+00:00","breadcrumb":{"@id":"https:\/\/ees.it\/en\/x-ray-analysis\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/ees.it\/en\/x-ray-analysis\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/ees.it\/en\/x-ray-analysis\/#primaryimage","url":"https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/icon-pdf.ico","contentUrl":"https:\/\/ees.it\/wp-content\/uploads\/2017\/12\/icon-pdf.ico"},{"@type":"BreadcrumbList","@id":"https:\/\/ees.it\/en\/x-ray-analysis\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/ees.it\/en\/"},{"@type":"ListItem","position":2,"name":"X-RAY Analysis"}]},{"@type":"WebSite","@id":"https:\/\/ees.it\/#website","url":"https:\/\/ees.it\/","name":"Electronic Engineering Service","description":"Apparecchiature e schede elettroniche","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/ees.it\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"}]}},"_links":{"self":[{"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/pages\/11504","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/comments?post=11504"}],"version-history":[{"count":7,"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/pages\/11504\/revisions"}],"predecessor-version":[{"id":14437,"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/pages\/11504\/revisions\/14437"}],"wp:attachment":[{"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/media?parent=11504"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}