{"id":11547,"date":"2012-01-22T23:14:12","date_gmt":"2012-01-22T23:14:12","guid":{"rendered":"http:\/\/www.ees.it\/?page_id=11547&#038;lang=en"},"modified":"2018-05-30T11:39:20","modified_gmt":"2018-05-30T11:39:20","slug":"testing-analysis","status":"publish","type":"page","link":"https:\/\/ees.it\/en\/testing-analysis\/","title":{"rendered":"Testing &#038; Analysis"},"content":{"rendered":"<p><div class=\"fusion-fullwidth fullwidth-box fusion-builder-row-1 nonhundred-percent-fullwidth non-hundred-percent-height-scrolling\" style=\"--awb-background-position:left top;--awb-border-radius-top-left:0px;--awb-border-radius-top-right:0px;--awb-border-radius-bottom-right:0px;--awb-border-radius-bottom-left:0px;--awb-padding-top:1%;--awb-padding-bottom:1%;--awb-margin-top:0px;--awb-margin-bottom:0px;--awb-border-sizes-top:0px;--awb-border-sizes-bottom:0px;--awb-flex-wrap:wrap;\" ><div class=\"fusion-builder-row fusion-row\"><div class=\"fusion-layout-column fusion_builder_column fusion-builder-column-0 fusion_builder_column_1_1 1_1 fusion-one-full fusion-column-first fusion-column-last fusion-column-no-min-height\" style=\"--awb-bg-size:cover;--awb-margin-bottom:0px;\"><div class=\"fusion-column-wrapper fusion-flex-column-wrapper-legacy\"><div class=\"fusion-text fusion-text-1\"><h1 style=\"text-align: center;\">Testing &amp; Analysis<\/h1>\n<\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-separator\" style=\"margin-left: auto;margin-right: auto;margin-top:-15px;margin-bottom:20px;width:100%;max-width:300px;\"><div class=\"fusion-separator-border sep-single sep-solid\" style=\"--awb-height:20px;--awb-amount:20px;--awb-sep-color:#00b8e0;border-color:#00b8e0;border-top-width:1px;\"><\/div><\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-text fusion-text-2\"><h3 style=\"text-align: center;\"><strong>The Controls and Tests carried out by EES<\/strong><\/h3>\n<\/div><div class=\"fusion-clearfix\"><\/div><\/div><\/div><\/div><\/div><div class=\"fusion-fullwidth fullwidth-box fusion-builder-row-2 nonhundred-percent-fullwidth non-hundred-percent-height-scrolling fusion-equal-height-columns\" style=\"--awb-background-position:left top;--awb-border-radius-top-left:0px;--awb-border-radius-top-right:0px;--awb-border-radius-bottom-right:0px;--awb-border-radius-bottom-left:0px;--awb-padding-top:0px;--awb-padding-bottom:50px;--awb-border-sizes-top:0px;--awb-border-sizes-bottom:0px;--awb-flex-wrap:wrap;\" ><div class=\"fusion-builder-row fusion-row\"><div class=\"fusion-layout-column fusion_builder_column fusion-builder-column-1 fusion_builder_column_1_3 1_3 fusion-one-third fusion-column-first fusion-column-inner-bg-wrapper fusion-column-liftup-border\" style=\"--awb-padding-top:25px;--awb-padding-right:25px;--awb-padding-bottom:25px;--awb-padding-left:25px;--awb-inner-bg-size:cover;--awb-border-color:#ededed;--awb-inner-border-color:#ededed;--awb-border-top:1px;--awb-inner-border-top:1px;--awb-border-right:1px;--awb-inner-border-right:1px;--awb-border-bottom:1px;--awb-inner-border-bottom:1px;--awb-border-left:1px;--awb-inner-border-left:1px;--awb-border-style:solid;--awb-inner-border-style:solid;width:30.6666%; margin-right: 4%;\"><span class=\"fusion-column-inner-bg hover-type-liftup\"><a class=\"fusion-column-anchor\" href=\"https:\/\/ees.it\/ispezione-ottica-automatica\/\"><span class=\"fusion-column-inner-bg-image\"><\/span><\/a><\/span><div class=\"fusion-column-wrapper fusion-flex-column-wrapper-legacy\"><div class=\"fusion-fa-align-center\"><i class=\"fb-icon-element-1 fb-icon-element fontawesome-icon fa fa-search circle-yes\" style=\"--awb-circlecolor:#00b8e0;--awb-circlecolor-hover:#00b8e0;--awb-circlebordercolor:#00b8e0;--awb-circlebordercolor-hover:#00b8e0;--awb-circlebordersize:1px;--awb-font-size:44px;--awb-width:88px;--awb-height:88px;--awb-line-height:86px;\"><\/i><\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-separator fusion-full-width-sep\" style=\"margin-left: auto;margin-right: auto;margin-top:18px;width:100%;\"><\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-text fusion-text-3\"><h2 style=\"text-align: center;\"><strong>Automatic Optical Inspection<\/strong><\/h2>\n<\/div><div class=\"fusion-text fusion-text-4\"><p style=\"text-align: center;\">In order to minimize the possibility that the boards present assembly and welding defects, before they are sent to the electrical test and to any functional testing, EES after the assembly process smt and tht submits all the cards to optical inspection.<\/p>\n<\/div><div class=\"fusion-clearfix\"><\/div><\/div><\/div><div class=\"fusion-layout-column fusion_builder_column fusion-builder-column-2 fusion_builder_column_1_3 1_3 fusion-one-third fusion-column-inner-bg-wrapper fusion-column-liftup-border\" style=\"--awb-padding-top:25px;--awb-padding-right:25px;--awb-padding-bottom:2px;--awb-padding-left:25px;--awb-inner-bg-size:cover;--awb-border-color:#ededed;--awb-inner-border-color:#ededed;--awb-border-top:1px;--awb-inner-border-top:1px;--awb-border-right:1px;--awb-inner-border-right:1px;--awb-border-bottom:1px;--awb-inner-border-bottom:1px;--awb-border-left:1px;--awb-inner-border-left:1px;--awb-border-style:solid;--awb-inner-border-style:solid;width:30.6666%; margin-right: 4%;\"><span class=\"fusion-column-inner-bg hover-type-liftup\"><a class=\"fusion-column-anchor\" href=\"https:\/\/ees.it\/analisi-x-ray\/\"><span class=\"fusion-column-inner-bg-image\"><\/span><\/a><\/span><div class=\"fusion-column-wrapper fusion-flex-column-wrapper-legacy\"><div class=\"fusion-fa-align-center\"><i class=\"fb-icon-element-2 fb-icon-element fontawesome-icon fa fa-bolt circle-yes\" style=\"--awb-circlecolor:#00b8e0;--awb-circlecolor-hover:#00b8e0;--awb-circlebordercolor:#00b8e0;--awb-circlebordercolor-hover:#00b8e0;--awb-circlebordersize:1px;--awb-font-size:44px;--awb-width:88px;--awb-height:88px;--awb-line-height:86px;\"><\/i><\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-separator fusion-full-width-sep\" style=\"margin-left: auto;margin-right: auto;margin-top:18px;width:100%;\"><\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-text fusion-text-5\"><h2 style=\"text-align: center;\"><strong>X-RAY micro-focus source inspection and analysis<\/strong><\/h2>\n<\/div><div class=\"fusion-text fusion-text-6\"><p style=\"text-align: center;\">EES uses a micro-focus X-ray system to verify the quality of the welds, to evaluate the size of any voids, to search for faults and to identify the critical points on which to intervene for the repair of printed circuits, connectors and wiring in general.<\/p>\n<\/div><div class=\"fusion-clearfix\"><\/div><\/div><\/div><div class=\"fusion-layout-column fusion_builder_column fusion-builder-column-3 fusion_builder_column_1_3 1_3 fusion-one-third fusion-column-last fusion-column-inner-bg-wrapper fusion-column-liftup-border\" style=\"--awb-padding-top:25px;--awb-padding-right:25px;--awb-padding-bottom:25px;--awb-padding-left:25px;--awb-inner-bg-size:cover;--awb-border-color:#ededed;--awb-inner-border-color:#ededed;--awb-border-top:1px;--awb-inner-border-top:1px;--awb-border-right:1px;--awb-inner-border-right:1px;--awb-border-bottom:1px;--awb-inner-border-bottom:1px;--awb-border-left:1px;--awb-inner-border-left:1px;--awb-border-style:solid;--awb-inner-border-style:solid;width:30.6666%;\"><span class=\"fusion-column-inner-bg hover-type-liftup\"><a class=\"fusion-column-anchor\" href=\"https:\/\/ees.it\/sistema-di-collaudo-flying-probe\/\"><span class=\"fusion-column-inner-bg-image\"><\/span><\/a><\/span><div class=\"fusion-column-wrapper fusion-flex-column-wrapper-legacy\"><div class=\"fusion-fa-align-center\"><i class=\"fb-icon-element-3 fb-icon-element fontawesome-icon fa fa-wrench circle-yes\" style=\"--awb-circlecolor:#00b8e0;--awb-circlecolor-hover:#00b8e0;--awb-circlebordercolor:#00b8e0;--awb-circlebordercolor-hover:#00b8e0;--awb-circlebordersize:1px;--awb-font-size:44px;--awb-width:88px;--awb-height:88px;--awb-line-height:86px;\"><\/i><\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-separator fusion-full-width-sep\" style=\"margin-left: auto;margin-right: auto;margin-top:18px;width:100%;\"><\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-text fusion-text-7\"><h2 style=\"text-align: center;\"><strong>Test system with mobile probes<\/strong><\/h2>\n<\/div><div class=\"fusion-text fusion-text-8\"><p style=\"text-align: center;\">In order to ensure maximum reliability of the electronic boards exiting from its assembly line, EES is equipped to perform electrical checks using mobile probes with the help of a Spea &#8220;Flying Probe 4040 Top Line&#8221; machine, a test system high flexibility and at the same time with low costs.<\/p>\n<\/div><div class=\"fusion-clearfix\"><\/div><\/div><\/div><div class=\"fusion-layout-column fusion_builder_column fusion-builder-column-4 fusion_builder_column_1_2 1_2 fusion-one-half fusion-column-first fusion-column-inner-bg-wrapper fusion-column-liftup-border\" style=\"--awb-padding-top:25px;--awb-padding-right:25px;--awb-padding-bottom:25px;--awb-padding-left:25px;--awb-inner-bg-size:cover;--awb-border-color:#ededed;--awb-inner-border-color:#ededed;--awb-border-top:1px;--awb-inner-border-top:1px;--awb-border-right:1px;--awb-inner-border-right:1px;--awb-border-bottom:1px;--awb-inner-border-bottom:1px;--awb-border-left:1px;--awb-inner-border-left:1px;--awb-border-style:solid;--awb-inner-border-style:solid;width:48%; margin-right: 4%;\"><span class=\"fusion-column-inner-bg hover-type-liftup\"><a class=\"fusion-column-anchor\" href=\"https:\/\/ees.it\/collaudi-funzionali\/\"><span class=\"fusion-column-inner-bg-image\"><\/span><\/a><\/span><div class=\"fusion-column-wrapper fusion-flex-column-wrapper-legacy\"><div class=\"fusion-fa-align-center\"><i class=\"fb-icon-element-4 fb-icon-element fontawesome-icon fa fa-check circle-yes\" style=\"--awb-circlecolor:#00b8e0;--awb-circlecolor-hover:#00b8e0;--awb-circlebordercolor:#00b8e0;--awb-circlebordercolor-hover:#00b8e0;--awb-circlebordersize:1px;--awb-font-size:44px;--awb-width:88px;--awb-height:88px;--awb-line-height:86px;\"><\/i><\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-separator fusion-full-width-sep\" style=\"margin-left: auto;margin-right: auto;margin-top:18px;width:100%;\"><\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-text fusion-text-9\"><h2 style=\"text-align: center;\"><strong>Functional tests tailored<\/strong><\/h2>\n<\/div><div class=\"fusion-text fusion-text-10\"><p style=\"text-align: center;\">EES technical staff, highly specialized, is able to perform any type of functional test required, either using the specifications and equipment provided by the customer, or independently developing dedicated equipment able to perform the different types of tests required<\/p>\n<\/div><div class=\"fusion-clearfix\"><\/div><\/div><\/div><div class=\"fusion-layout-column fusion_builder_column fusion-builder-column-5 fusion_builder_column_1_2 1_2 fusion-one-half fusion-column-last fusion-column-inner-bg-wrapper fusion-column-liftup-border\" style=\"--awb-padding-top:25px;--awb-padding-right:25px;--awb-padding-bottom:25px;--awb-padding-left:25px;--awb-inner-bg-size:cover;--awb-border-color:#ededed;--awb-inner-border-color:#ededed;--awb-border-top:1px;--awb-inner-border-top:1px;--awb-border-right:1px;--awb-inner-border-right:1px;--awb-border-bottom:1px;--awb-inner-border-bottom:1px;--awb-border-left:1px;--awb-inner-border-left:1px;--awb-border-style:solid;--awb-inner-border-style:solid;width:48%;\"><span class=\"fusion-column-inner-bg hover-type-liftup\"><a class=\"fusion-column-anchor\" href=\"https:\/\/ees.it\/prove-di-stabilita\/\"><span class=\"fusion-column-inner-bg-image\"><\/span><\/a><\/span><div class=\"fusion-column-wrapper fusion-flex-column-wrapper-legacy\"><div class=\"fusion-fa-align-center\"><i class=\"fb-icon-element-5 fb-icon-element fontawesome-icon fa fa-fire circle-yes\" style=\"--awb-circlecolor:#00b8e0;--awb-circlecolor-hover:#00b8e0;--awb-circlebordercolor:#00b8e0;--awb-circlebordercolor-hover:#00b8e0;--awb-circlebordersize:1px;--awb-font-size:44px;--awb-width:88px;--awb-height:88px;--awb-line-height:86px;\"><\/i><\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-separator fusion-full-width-sep\" style=\"margin-left: auto;margin-right: auto;margin-top:18px;width:100%;\"><\/div><div class=\"fusion-sep-clear\"><\/div><div class=\"fusion-text fusion-text-11\"><h2 style=\"text-align: center;\"><strong>Stability tests with climatic chamber<\/strong><\/h2>\n<\/div><div class=\"fusion-text fusion-text-12\"><p style=\"text-align: center;\">Thanks to the ACS &#8220;EOS 200 T&#8221; climatic chamber it is possible to carry out simulated environmental tests with customizable temperature cycles (Range from -40 \u00b0 C to + 180 \u00b0 C). These tests make it possible to highlight any latent defects of the product and to determine the robustness of the components, thus contributing to reinforcing confidence in their reliability.<\/p>\n<\/div><div class=\"fusion-clearfix\"><\/div><\/div><\/div><\/div><\/div><\/p>\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"100-width.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-11547","page","type-page","status-publish","hentry"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.4 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>x-ray, bga, fling probe, sonde mobili, collaudo funzionale, test ottico, test aoi, test ottico automatico, smt, smd, assemblaggio schede, elettronica, eletronica<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/ees.it\/en\/testing-analysis\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"x-ray, bga, fling probe, sonde mobili, collaudo funzionale, test ottico, test aoi, test ottico automatico, smt, smd, assemblaggio schede, elettronica, eletronica\" \/>\n<meta property=\"og:url\" content=\"https:\/\/ees.it\/en\/testing-analysis\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Engineering Service\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/ees.spa.it\" \/>\n<meta property=\"article:modified_time\" content=\"2018-05-30T11:39:20+00:00\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"7 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/ees.it\\\/en\\\/testing-analysis\\\/\",\"url\":\"https:\\\/\\\/ees.it\\\/en\\\/testing-analysis\\\/\",\"name\":\"x-ray, bga, fling probe, sonde mobili, collaudo funzionale, test ottico, test aoi, test ottico automatico, smt, smd, assemblaggio schede, elettronica, eletronica\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/ees.it\\\/#website\"},\"datePublished\":\"2012-01-22T23:14:12+00:00\",\"dateModified\":\"2018-05-30T11:39:20+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/ees.it\\\/en\\\/testing-analysis\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/ees.it\\\/en\\\/testing-analysis\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/ees.it\\\/en\\\/testing-analysis\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/ees.it\\\/en\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Testing &#038; 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Analysis"}]},{"@type":"WebSite","@id":"https:\/\/ees.it\/#website","url":"https:\/\/ees.it\/","name":"Electronic Engineering Service","description":"Apparecchiature e schede elettroniche","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/ees.it\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"}]}},"_links":{"self":[{"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/pages\/11547","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/comments?post=11547"}],"version-history":[{"count":4,"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/pages\/11547\/revisions"}],"predecessor-version":[{"id":14384,"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/pages\/11547\/revisions\/14384"}],"wp:attachment":[{"href":"https:\/\/ees.it\/en\/wp-json\/wp\/v2\/media?parent=11547"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}