Flying Probe test system<\/h1>\n<\/div><\/div><\/div><\/div><\/div>Electrical checks using mobile probes<\/strong><\/h3>\n<\/div><\/div><\/div><\/div><\/div><\/div>In order to ensure maximum reliability of electronic boards out of the Assembly line,EES is equipped to submit these cards to an electrical test flying probe; is the purpose used a machine Spea Flying Probe 4040 Top Line \u201c, a test system with high flexibility and at the same time at low cost.<\/p>\n
The main features of the 4040 Flying Probe are:<\/p>\n
\u00a0<\/div>\n<\/div>- <\/i><\/span>\n
Contemporary\u00a0probing\u00a0of both sides\u00a0(TOP and BOTTOM)<\/p>\n<\/div><\/li>
- <\/i><\/span>\n
High productivity thanks to linear motors with magnetic bearings and linear encoderson each axis X, Y, Z with a resolution of 0.1 um<\/p>\n<\/div><\/li>
- <\/i><\/span>\n
Test area\u00a0until\u00a0686x610mm<\/p>\n<\/div><\/li>
- <\/i><\/span>\n
On Board Program<\/p>\n<\/div><\/li>
- <\/i><\/span>\n
Boundary Scan<\/p>\n<\/div><\/li>
- <\/i><\/span>\n
Test NZT (Nodal Impedance Test)<\/p>\n<\/div><\/li>
- <\/i><\/span>\n
Test ICT, parametric equalizer<\/p>\n<\/div><\/li><\/ul>
Below is a list of the main possible controls:<\/p>\n
Shortcircuit; (from 100 to 1mOhm MOhm); capacity(capacitive value from 1pF to 1 F),check polarity, operating voltage, check technology, leakage current; inductance(inductive value from 10uH to 10:0), resistive value; diodes (forward voltage, reverse voltage, leakage current); zener diodes (polarity test,leakage current, type); check voltage bipolar transistors (Vbe, Vbc, Vce sat, Vce0) gain (HFE); check resistance Rds(on) mosfet transistors, voltage (Vdson and Vdsoff),polarity; check transformer winding resistance, winding inductance, phase windings ratio;check relay coil resistance, winding inductance, functional contacts, timemeasurement of implementation of contact and contact resistance close-open; fuse verification value, type; check voltage regulator output voltage at rated load andmaximum load, line and load regulation; operational amplifiers check positive and negative offset, offset voltages, Voltage Follower configuration, bias current, gain,frequency response, input and output impedance, slew rate; Dial gauges check positive and negative offset voltages, current offset bias, frequency response, input and output impedance, slew rate; Digital integrated check truth table, electrical characteristics, integration level, type of family, Fan in and Fan out.<\/p>\n<\/div>
<\/div><\/div><\/div><\/div><\/div>The Machine<\/h1>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div>Flying Probe 4040 Top Line<\/strong><\/h3>\n<\/div>![](\"https:\/\/ees.it\/wp-content\/uploads\/2012\/01\/182-3.jpg\" "\\"SPEA")
<\/span><\/div><\/div><\/div><\/div><\/div><\/div>In order for a board to be tested on the SPEA 4040 mobile probe system, its dimensions must be included in one of the following dimensions (length x width):<\/p>\n
– 500x400mm (20×16\u201d)
– 610x610mm (24×24\u201d)
– 686x610mm (27×24\u201d)<\/p>\n
In accordance with the system test area available.<\/p>\n<\/div>
Electrical checks using mobile probes<\/strong><\/h3>\n<\/div><\/div><\/div><\/div><\/div><\/div>In order to ensure maximum reliability of electronic boards out of the Assembly line,EES is equipped to submit these cards to an electrical test flying probe; is the purpose used a machine Spea Flying Probe 4040 Top Line \u201c, a test system with high flexibility and at the same time at low cost.<\/p>\n
The main features of the 4040 Flying Probe are:<\/p>\n
\u00a0<\/div>\n<\/div>- <\/i><\/span>\n
Contemporary\u00a0probing\u00a0of both sides\u00a0(TOP and BOTTOM)<\/p>\n<\/div><\/li>
- <\/i><\/span>\n
High productivity thanks to linear motors with magnetic bearings and linear encoderson each axis X, Y, Z with a resolution of 0.1 um<\/p>\n<\/div><\/li>
- <\/i><\/span>\n
Test area\u00a0until\u00a0686x610mm<\/p>\n<\/div><\/li>
- <\/i><\/span>\n
On Board Program<\/p>\n<\/div><\/li>
- <\/i><\/span>\n
Boundary Scan<\/p>\n<\/div><\/li>
- <\/i><\/span>\n
Test NZT (Nodal Impedance Test)<\/p>\n<\/div><\/li>
- <\/i><\/span>\n
Test ICT, parametric equalizer<\/p>\n<\/div><\/li><\/ul>
Below is a list of the main possible controls:<\/p>\n
Shortcircuit; (from 100 to 1mOhm MOhm); capacity(capacitive value from 1pF to 1 F),check polarity, operating voltage, check technology, leakage current; inductance(inductive value from 10uH to 10:0), resistive value; diodes (forward voltage, reverse voltage, leakage current); zener diodes (polarity test,leakage current, type); check voltage bipolar transistors (Vbe, Vbc, Vce sat, Vce0) gain (HFE); check resistance Rds(on) mosfet transistors, voltage (Vdson and Vdsoff),polarity; check transformer winding resistance, winding inductance, phase windings ratio;check relay coil resistance, winding inductance, functional contacts, timemeasurement of implementation of contact and contact resistance close-open; fuse verification value, type; check voltage regulator output voltage at rated load andmaximum load, line and load regulation; operational amplifiers check positive and negative offset, offset voltages, Voltage Follower configuration, bias current, gain,frequency response, input and output impedance, slew rate; Dial gauges check positive and negative offset voltages, current offset bias, frequency response, input and output impedance, slew rate; Digital integrated check truth table, electrical characteristics, integration level, type of family, Fan in and Fan out.<\/p>\n<\/div>
<\/div><\/div><\/div><\/div><\/div>The Machine<\/h1>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div>Flying Probe 4040 Top Line<\/strong><\/h3>\n<\/div><\/span><\/div><\/div><\/div><\/div><\/div><\/div>In order for a board to be tested on the SPEA 4040 mobile probe system, its dimensions must be included in one of the following dimensions (length x width):<\/p>\n
– 500x400mm (20×16\u201d)
– 610x610mm (24×24\u201d)
– 686x610mm (27×24\u201d)<\/p>\n
In accordance with the system test area available.<\/p>\n<\/div>
In order to ensure maximum reliability of electronic boards out of the Assembly line,EES is equipped to submit these cards to an electrical test flying probe; is the purpose used a machine Spea Flying Probe 4040 Top Line \u201c, a test system with high flexibility and at the same time at low cost.<\/p>\n
The main features of the 4040 Flying Probe are:<\/p>\n
- <\/i><\/span>\n
Contemporary\u00a0probing\u00a0of both sides\u00a0(TOP and BOTTOM)<\/p>\n<\/div><\/li>
- <\/i><\/span>
\nHigh productivity thanks to linear motors with magnetic bearings and linear encoderson each axis X, Y, Z with a resolution of 0.1 um<\/p>\n<\/div><\/li>
- <\/i><\/span>
\nTest area\u00a0until\u00a0686x610mm<\/p>\n<\/div><\/li>
- <\/i><\/span>
\nOn Board Program<\/p>\n<\/div><\/li>
- <\/i><\/span>
\nBoundary Scan<\/p>\n<\/div><\/li>
- <\/i><\/span>
\nTest NZT (Nodal Impedance Test)<\/p>\n<\/div><\/li>
- <\/i><\/span>
\nTest ICT, parametric equalizer<\/p>\n<\/div><\/li><\/ul>
Below is a list of the main possible controls:<\/p>\n
Shortcircuit; (from 100 to 1mOhm MOhm); capacity(capacitive value from 1pF to 1 F),check polarity, operating voltage, check technology, leakage current; inductance(inductive value from 10uH to 10:0), resistive value; diodes (forward voltage, reverse voltage, leakage current); zener diodes (polarity test,leakage current, type); check voltage bipolar transistors (Vbe, Vbc, Vce sat, Vce0) gain (HFE); check resistance Rds(on) mosfet transistors, voltage (Vdson and Vdsoff),polarity; check transformer winding resistance, winding inductance, phase windings ratio;check relay coil resistance, winding inductance, functional contacts, timemeasurement of implementation of contact and contact resistance close-open; fuse verification value, type; check voltage regulator output voltage at rated load andmaximum load, line and load regulation; operational amplifiers check positive and negative offset, offset voltages, Voltage Follower configuration, bias current, gain,frequency response, input and output impedance, slew rate; Dial gauges check positive and negative offset voltages, current offset bias, frequency response, input and output impedance, slew rate; Digital integrated check truth table, electrical characteristics, integration level, type of family, Fan in and Fan out.<\/p>\n<\/div>
<\/div><\/div><\/div><\/div><\/div>The Machine<\/h1>\n<\/div>
<\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div>Flying Probe 4040 Top Line<\/strong><\/h3>\n<\/div>
<\/span><\/div><\/div><\/div><\/div><\/div><\/div>In order for a board to be tested on the SPEA 4040 mobile probe system, its dimensions must be included in one of the following dimensions (length x width):<\/p>\n
– 500x400mm (20×16\u201d)
– 610x610mm (24×24\u201d)
– 686x610mm (27×24\u201d)<\/p>\nIn accordance with the system test area available.<\/p>\n<\/div>
- <\/i><\/span>